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WHAT'S NEW?

The aim of this project was to construct a system which would non-invasively measure film thickness in real-time. This was achieved using a polarized laser, which can detect even slight deposits- without removing the sample. Changing system parameters every 5 minutes will result in drastic time and equipment savings- reducing the resources expended in determining the 'operating window' of a new material.

Click on the system photo for a larger version.